High-speed Fizeau interferometry for film topography measurement during spray film interaction

Schumacher, Leif (Corresponding author); Seel, Kevin; Reddemann, Manuel Armin; Kneer, Reinhold (Last author)

S.l.] : American Institute of Physics (2018)
Fachzeitschriftenartikel

In: Review of scientific instruments
Band: 89
Heft: 11
Seite(n)/Artikel-Nr.: 113703