High-speed Fizeau interferometry for film topography measurement during spray film interaction

Schumacher, Leif (Corresponding author); Seel, Kevin; Reddemann, Manuel Armin; Kneer, Reinhold (Last author)

S.l.] : American Institute of Physics (2018)
Journal Article

In: Review of scientific instruments
Volume: 89
Issue: 11
Page(s)/Article-Nr.: 113703

Identifier