Planar LIF For Quantification Of Liquid Removal And Deposition During Spray-Wall-Film-Interaction

Schumacher, Leif; Zuschlag, Moritz; Bieber, Malte; Reddemann, Manuel Armin; Kneer, Reinhold

New York, NY : Begell House (2020)
Journal Article

In: Atomization and sprays
Volume: 30
Issue: 11
Page(s)/Article-Nr.: 799-810

Identifier